Thermal-Aware Testing of Digital VLSI Circuits and Systems [True PDF]

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pdf | 5.04 MB | English | Isbn:‎ B07CMDMGTV | Author: Santanu Chattopadhyay | Year: 2018

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Description:

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level

Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques

This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

Category:Microelectronics Engineering, Computer Programming Logic, Circuit Engineering

https://1dl.net/ub7tpk188kg8