Myeongkyu Lee, "X-Ray Diffraction for Materials Research: From Fundamentals to Applications"
2016 | ISBN: 1771882980 | English | 302 pages | PDF | 21 MB
This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction.
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